1. High resolution X-ray diffractometry and topography
Author: / D. Keith Bowen, Brian K. Tanner
Library: Central Library and Documents Center of Mazandaran University (Mazandaran)
Subject: X-ray crystallography.,X-rays- Diffraction.,Crystals
Classification :
QD945
.
B683
1998
2. High resolution X-ray diffractometry and topography
Author: / D. Keith Bowen and Brian K. Tanner
Library: Central Library and Document Center of Shahid Chamran University (Khuzestan)
Subject: X-ray crystallography.,X-rays--Diffraction,Crystals.
Classification :
QD
,
945
,.
B683
,
1998
3. Introduction to the physics of electrons in solids
Author: / Brian K. Tanner
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Solid state physics,Energy-band theory of solids,Semiconductors
Classification :
QC
176
.
T32
1995
4. Introduction to the physics of electrons in solids
Author: Tanner, B. K.)Brian Keith(
Library: Central Library and Documentation Center (Kerman)
Subject: ، Solid state physics,، Energy-band theory of solids,، Semiconductors
Classification :
QC
176
.
T32
1995
5. Introduction to the physics of electrons in solids
پدیدآورنده : Brian K. Tanner
موضوع : Solid state physics,Energy - Band theroy of solids,Semiconductors
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
6. Introduction to the physics of electrons in solids
Author: / Brian K. Tanner
Library: Central Library and Document Center of Arak University (Markazi)
Subject: Solid state physics,Energy-- band theory of solids,Semiconductors
Classification :
530
.
411
T166t
7. Introduction to the physics of electrons in solids
Author: / Brian K. Tanner
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Solid state physics,Energy-band theory of solids,Semiconductors
Classification :
QC
176
.
T32
1995
8. Introduction to the physics of elements in solids
Author: Brian K. Tanner,Title
Library: Central Library of Imam Khomeini International University of Qazvin (Qazvin)
Subject: Solid state physics,Energy-band theory of solid,Semiconductors
Classification :
QC
.
T32
176
1995
9. X-ray and neutron dynamical diffraction
Author: / edited by Andrae Authier, Stefano Lagomarsino, and Brian K. Tanner
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: X-rays, Diffraction, Congresses,Neutrons, Diffraction, Congresses,X-ray crystallography, Congresses,Interferometry, Neutron, Congresses
Classification :
QC482
.
D5
X68
,
1996
10. X-ray diffraction topography
Author: Tanner, B. K.)Brian Keith(
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، X-ray crystallography
Classification :
QD
945
.
T36
1976
11. X-ray metrology in semiconductor manufacturing
Author: / D. Keith Bowen, Brian K. Tanner
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Semiconductors--Design and construction--Quality control,Integrated circuits--Measurement,Semiconductor wafers--Inspection,X-rays--Diffraction,Fluroscopy
Classification :
TK7874
.
58
.
B69
2006
12. X-ray metrology in semiconductor manufacturing
Author: / D. Keith Bowen, Brian K. Tanner
Library: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
Subject: Semiconductors- Design and construction- Quality control,Integrated circuits- Measurement,Semiconductor wafers- Inspection,X-rays- Diffraction,Fluroscopy
Classification :
TK7874
.
58
.
B69
2006
13. X-ray metrology in semiconductor manufacturing
Author: / D. Keith Bowen, Brian K. Tanner
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Semiconductors , Design and construction , Quality control,Integrated circuits , Measurement,Semiconductor wafers , Inspection,X-rays , Diffraction,Fluroscopy
Classification :
E-BOOK
